Description
Ring oscillators (ROs) are often used in true random number generators (TRNGs). The jitter of their clock signal, used as a source of randomness, stems from thermal and flicker noises. While thermal noise jitter is often identified as the main source of randomness, flicker noise jitter is not taken into account due to its autocorrelated nature which greatly complexifies modelling. However, it is a noise that has an increasingly large contribution as technology nodes decrease. This talk presents our recent work studying the influence of flicker noise on the entropy of a RO-based TRNG. The methodology is based on a phase noise emulator that integrates flicker and thermal noises, and generates jittered time series thus enabling the output of the TRNG (series of random bits) to be obtained. From this emulator, the impact of the flicker noise on the entropy can be quantified and analysed.
Infos pratiques
Prochains exposés
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Securing processor's microarchitecture against SCA in a post-quantum cryptography setting
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Side-channel
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Micro-architectural vulnerabilities
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Onysis: A secure European SoC FPGA
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SemSecuElec
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Using High Level Profiling Data to Early Assess the Fault Tolerance of Complex Digital Components
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Fault injection
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