Description
While traditional chips in bulk silicon technology are widely used for reliable and highly ef?cient systems, there are applications that call for devices in other technologies. On the one hand, novel device technologies need to be re-evaluated with respect to potential threats and attacks, and how these can be faced with existing and novel security solutions and methods. On the other hand, emerging device technologies bring opportunities for building the secure systems of the future. This talk gives an overview of the minimal hardware resources that are needed to build secure systems and discusses a case study on flexible electronics on plastics.
Next sessions
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Securing processor's microarchitecture against SCA in a post-quantum cryptography setting
Speaker : Vincent MIGLIORE - LAAS-CNRS
Hardware microarchitecture is a well-known source of side-channel leakages, providing a notable security reduction of standard cryptographic algorithms (e.g. AES) if not properly addressed by software or hardware. In this talk, we present new design approaches to harden processor's microarchitecture against power-based side-channel attacks, relying on configurable and cascadable building blocks[…]-
SemSecuElec
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Side-channel
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Micro-architectural vulnerabilities
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Onysis: A secure European SoC FPGA
Speaker : Adrien GRASSEIN - Nanoxplore
Developed in collaboration with the DGA, the Onysis project introduces a European SoC FPGA designed to embed advanced hardware security features. This presentation will provide an overview of the Onysis architecture, focusing specifically on its native mechanisms to protect critical systems. We will detail the implementation of its integrated security subsystem, covering the secure boot sequence[…]-
SemSecuElec
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Using High Level Profiling Data to Early Assess the Fault Tolerance of Complex Digital Components
Speaker : Luc NOIZETTE - Nuclétudes (filiale Ariane group)
This presentation outlines an innovative methodology for estimating the fault tolerance of complex components based on application profiling obtained using a high-level virtual platform. A derating factor, derived exclusively from profiling metrics (e.g., lifetime in memory and registers), is calibrated using a reliability dataset collected from a set of benchmarks. Applying it to test softwares[…]-
SemSecuElec
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Fault injection
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